This meeting is dedicated to microscopy of materials comprised of both organic and inorganic constituents in close proximity and is aimed at bringing together experts from both the life science and materials science communities to address this challenging and increasingly important topic.

    Different approaches such as the application of correlative microscopy solutions, low-voltage and cryogenic electron microscopy techniques, in-situ electron microscopy and methods for fast acquisition are discussed during the meeting in the context of studying hybrid materials. 

    This year’s Focus Lecture Series is dedicated to "Advances in imaging beam sensitive materials in the transmission electron microscope” and is co-organized by Prof. Dr. Rafal E. Dunin-Borkowski, Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, Germany. The Focus lectures will cover topics that include the use of novel imaging modes in both TEM and scanning TEM to image electron beam sensitive materials, as well as computational approaches for extracting quantitative information from both images and diffraction patterns.

    We hope that you will be pleased with our exciting programme and that it will stimulate creative thinking, resulting in new ideas and collaborations.

Scientific organizers